Delay faults (Semiconductors)
From Library of Congress Subject Headings
Delay faults (Semiconductors)
URI(s)
- http://id.loc.gov/authorities/subjects/sh98004946
- info:lc/authorities/sh98004946
- http://id.loc.gov/authorities/sh98004946#concept
Instance Of
Scheme Membership(s)
Collection Membership(s)
Variants
- Delay defects (Semiconductors)
Broader Terms
Sources
- found: Work cat.: 98-39137: Delay fault testing for VLSI circuits, 1998.
- found: ASTI on FirstSearch, Aug. 6, 1998 (subject hdg.: Delay faults; in a title: delay defects)
Change Notes
- 1998-08-06: new
Alternate Formats
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