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Bibframe Work

Title
1998 IEEE Autotestcon proceedings
Other Titles (e.g. Variant)
1998 IEEE Autotestcon
Test technology for the 21st Century
Type
Text
Monograph
Contribution
Autotestcon (34th : 1998 : Salt Lake City, Utah) (Contributor)
Institute of Electrical and Electronics Engineers (Contributor)
Subject
Systems engineering--Congresses (LCSH)
Automatic test equipment--Congresses (LCSH)
Avionics--Testing--Congresses (LCSH)
Military supplies--Testing--Congresses (LCSH)
Motor vehicles--Testing--Congresses (LCSH)
Language
English
Illustrative Content
Illustrations
Classification
LCC: TJ212.2 .A974 1998
DDC: 670.42/5 full
Could not render: bf:status
Supplementary Content
bibliography
Content
text
Authorized Access Point
Autotestcon (34th : 1998 : Salt Lake City, Utah) 1998 IEEE Autotestcon proceedings