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BIBFRAME Instances
5
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4
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Results: 1-9 of 9
1
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Dataset
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Identifier
1.
International Workshop on Ultrasonic and Dielectric Characterization Techniques for Suspended Particulates (1997 : Gaithersburg, Md.) Handbook on ultrasonic and dielectric characterization techniques for suspended particulates Westerville, Ohio: American Ceramic Society; c1998
BIBFRAME Instances
Instance
13224218
2.
International Workshop on Ultrasonic and Dielectric Characterization Techniques for Suspended Particulates (1997 : Gaithersburg, Md.) Handbook on ultrasonic and dielectric characterization techniques for suspended particulates
BIBFRAME Works
Work
Text
Monograph
13224218
3.
United States. Office of Scientific Research and Development. National Defense Research Committee. Techniques and calculations used in dielectric measurements on shorted lines. (Report No. 490.) [United States]: [Office of Scientific Research and Development, National Defense Research Committee, Division 14-Radar]; [between 1940 and 1947]
BIBFRAME Instances
Instance
21844557
4.
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (1991 : Phoenix, Ariz.) Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Pennington, NJ: Electrochemical Society; c1992
BIBFRAME Instances
Instance
4398805
5.
Bentini, G. G. Dielectric layers in semiconductors Les Ulis, France: Editions de physique; c1986
BIBFRAME Instances
Instance
4353787
6.
Techniques and calculations used in dielectric measurements on shorted lines. (Report No. 490.)
BIBFRAME Works
Work
Text
Monograph
Multimedia
21844557
7.
Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (1991 : Phoenix, Ariz.) Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
BIBFRAME Works
Work
Text
Monograph
4398805
8.
Schroder, Dieter K. Analytical and diagnostic techniques for semiconductor materials, devices, and processes 7 / editors: D.K. Schroder .... [et al.] Pennington, NJ: Electrochemical Society; c2007
BIBFRAME Instances
Instance
15419088
9.
Analytical and diagnostic techniques for semiconductor materials, devices, and processes 7 / editors: D.K. Schroder .... [et al.]
BIBFRAME Works
Work
Text
Monograph
15419088
Results: 1-9 of 9
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