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1. International Workshop on Ultrasonic and Dielectric Characterization Techniques for Suspended Particulates (1997 : Gaithersburg, Md.) Handbook on ultrasonic and dielectric characterization techniques for suspended particulates Westerville, Ohio: American Ceramic Society; c1998

 BIBFRAME Instances
 Instance 13224218
2. International Workshop on Ultrasonic and Dielectric Characterization Techniques for Suspended Particulates (1997 : Gaithersburg, Md.) Handbook on ultrasonic and dielectric characterization techniques for suspended particulates

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Text
Monograph		 13224218
3. United States. Office of Scientific Research and Development. National Defense Research Committee. Techniques and calculations used in dielectric measurements on shorted lines. (Report No. 490.) [United States]: [Office of Scientific Research and Development, National Defense Research Committee, Division 14-Radar]; [between 1940 and 1947]

 BIBFRAME Instances
 Instance 21844557
4. Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (1991 : Phoenix, Ariz.) Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Pennington, NJ: Electrochemical Society; c1992

 BIBFRAME Instances
 Instance 4398805
5. Bentini, G. G. Dielectric layers in semiconductors Les Ulis, France: Editions de physique; c1986

 BIBFRAME Instances
 Instance 4353787
6. Techniques and calculations used in dielectric measurements on shorted lines. (Report No. 490.)

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Text
Monograph
Multimedia		 21844557
7. Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (1991 : Phoenix, Ariz.) Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

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Text
Monograph		 4398805
8. Schroder, Dieter K. Analytical and diagnostic techniques for semiconductor materials, devices, and processes 7 / editors: D.K. Schroder .... [et al.] Pennington, NJ: Electrochemical Society; c2007

 BIBFRAME Instances
 Instance 15419088
9. Analytical and diagnostic techniques for semiconductor materials, devices, and processes 7 / editors: D.K. Schroder .... [et al.]

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Text
Monograph		 15419088


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