Label | Dataset | Type | Subdivision | Identifier | |
---|---|---|---|---|---|
1. | Wilson, Robert G. Differential capacitance-voltage profiling of schottky barrier diodes for measuring implanted depth distributions in silicon Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards |
BIBFRAME Instances |
Instance | 4693794 | |
2. | Wilson, Robert G. Differential capacitance-voltage profiling of schottky barrier diodes for measuring implanted depth distributions in silicon |
BIBFRAME Works |
Work Text Monograph |
4693794 | |
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