Search - LC Linked Data Service: Authorities and Vocabularies

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	Label	Dataset	Type	Identifier
1.	Memory Assessment Scales	LC Classification (LCC)	ClassNumber Topic	BF375.5.M45
	Philosophy. Psychology. Religion--Psychology--Consciousness. Cognition--Association and reproduction of ideas--Special--Memory--Memory testing--Special tests, A-Z--Memory Assessment Scales ; Memory Assessment Scales (Memory test)
2.	Wide Range Assessment of Memory and Learning	LC Classification (LCC)	ClassNumber Topic	BF375.5.W53
	Philosophy. Psychology. Religion--Psychology--Consciousness. Cognition--Association and reproduction of ideas--Special--Memory--Memory testing--Special tests, A-Z--Wide Range Assessment of Memory and Learning ; Wide Range Assessment of Memory and Learning (Memory test)
3.	Wechsler Memory Scale	LC Classification (LCC)	ClassNumber Topic	BF375.5.W43
	Philosophy. Psychology. Religion--Psychology--Consciousness. Cognition--Association and reproduction of ideas--Special--Memory--Memory testing--Special tests, A-Z--Wechsler Memory Scale ; Wechsler Memory Scale
4.	IEEE International Workshop on Memory Technology, Design and Testing (10th : 2002 : Isle of Bendor, France) Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France Los Alamitos, Calif: IEEE Computer Society; c2002	BIBFRAME Instances	Instance	12906807

5.	IEEE International Workshop on Memory Technology, Design and Testing (8th : 2000 : San Jose, Calif.) Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing Los Alamitos, Calif: IEEE Computer Society; c2000	BIBFRAME Instances	Instance	12497328

6.	IEEE International Workshop on Memory Technology, Design, and Testing (14th : 2006 : Taipei, Taiwan) 2006 IEEE International Workshop on Memory Technology, Design, and Testing Los Alamitos, Calif: IEEE Computer Society; c2006	BIBFRAME Instances	Instance	14612517

7.	IEEE International Workshop on Memory Testing (1993 : San Jose, Calif.) Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California Los Alamitos, Calif: IEEE Computer Society Press; c1993	BIBFRAME Instances	Instance	1582002

8.	IEEE International Workshop on Memory Technology, Design, and Testing (1994 : San Jose, Calif.) Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California Los Alamitos, Calif: IEEE Computer Society Press; c1994	BIBFRAME Instances	Instance	1600284

9.	IEEE International Workshop on Memory Technology, Design, and Testing (13th : 2005 : Taipei, Taiwan) 2005 IEEE International Workshop on Memory Technology, Design and Testing Los Alamitos, Calif: IEEE Computer Society; c2005	BIBFRAME Instances	Instance	14421403

10.	IEEE International Workshop on Memory Technology, Design, and Testing (1995 : San Jose, Calif.) Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California Los Alamitos, Calif: IEEE Computer Society Press; c1995	BIBFRAME Instances	Instance	4455069

11.	IEEE International Workshop on Memory Technology, Design and Testing (11th : 2003 : San Jose, Calif.) Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California Los Alamitos, Calif: IEEE Computer Society; c2003	BIBFRAME Instances	Instance	13579966

12.	IEEE International Workshop on Memory Technology, Design, and Testing (13th : 2005 : Taipei, Taiwan) 2005 IEEE International Workshop on Memory Technology, Design and Testing	BIBFRAME Works	Work Text Monograph	14421403

13.	IEEE International Workshop on Memory Technology, Design, and Testing (17th : 2009 : Hsinchu City, Taiwan) MTDT 2009 Los Alamitos, Calif: IEEE Computer Society; c2009	BIBFRAME Instances	Instance	16492202

14.	IEEE International Workshop on Memory Technology, Design and Testing (12th : 2004 : San Jose, Calif.) MTDT 2004 Los Alamitos, Calif: IEEE Computer Society; c2004	BIBFRAME Instances	Instance	13864022

15.	IEEE International Workshop on Memory Technology, Design, and Testing (9th : 2001 : San Jose, Calif.) Proceedings Los Alamitos, Calif: IEEE Computer Society; c2001	BIBFRAME Instances	Instance	12593186

16.	IEEE International Workshop on Memory Technology, Design, and Testing (1997 : San Jose, Calif.) Proceedings Los Alamitos, Calif: IEEE Computer Society Press; c1997	BIBFRAME Instances	Instance	720131

17.	Sharp, Agnes A. (Agnes Arminda), 1893- An experimental test of Freud's doctrine of the relation of hedonic tone to memory revival ..	BIBFRAME Works	Work Text Monograph	5972918

18.	Silvapulle, Paramsothy Testing stationary nonnested short memory against long memory processes Bundoora, Vic., Australia: La Trobe University, Schools of Economics and Commerce; [1995]	BIBFRAME Instances	Instance	3076207

19.	IEEE International Workshop on Memory Technology, Design and Testing (1998 : San Jose, Calif.) Proceedings Los Alamitos, Calif: IEEE Computer Society; 1998	BIBFRAME Instances	Instance	11959909

20.	IEEE International Workshop on Memory Technology, Design and Testing (12th : 2004 : San Jose, Calif.) MTDT 2004	BIBFRAME Works	Work Text Monograph	13864022

Results: 1-20 of 60

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