| Label | Dataset | Type | Subdivision | Identifier | |
|---|---|---|---|---|---|
| 1. | Liu, Xiao Trace-Based Post-Silicon Validation for VLSI Circuits Cham: Springer International Publishing, Imprint: Springer; 2014 |
BIBFRAME Instances |
Instance | 21663693 | |
| 2. | Post-silicon validation and debug New York, NY: Springer Berlin Heidelberg; 2018 |
BIBFRAME Instances |
Instance | 20574605 | |
| 3. | Trace-based post-silicon validation for VLSI circuits New York: Springer; 2013 |
BIBFRAME Instances |
Instance | 17709724 | |
| 4. | Farahmandi, Farimah Post-Silicon Validation and Debug Cham: Springer International Publishing, Imprint: Springer; 2019 |
BIBFRAME Instances |
Instance | 21816976 | |
| 5. | Trace-based post-silicon validation for VLSI circuits |
BIBFRAME Works |
Work Text Monograph |
17709724 | |
| 6. | Post-silicon validation and debug |
BIBFRAME Works |
Work Text Monograph |
20574605 | |
| 7. | Post-Silicon Validation and Debug |
BIBFRAME Works |
Work Text Monograph Multimedia |
21816976 | |
| 8. | Liu, Xiao Trace-Based Post-Silicon Validation for VLSI Circuits |
BIBFRAME Works |
Work Text Monograph Multimedia |
21663693 | |
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