URI(s)
Identifies LC/NAF RWO
Identifies RWO
Exact Matching Concepts from Other Schemes
Closely Matching Concepts from Other Schemes
Sources
- found: Surface measurement and characterization, c1989:t.p. (Jean M. Bennett)
- found: Her Introduction to surface roughness and scattering, c1989:t.p. (Jean M. Bennett; Michelson Lab., Naval Weapons Ctr., China Lake, CA) p. [111] (b. 1930)
Instance Of
Scheme Membership(s)
Collection Membership(s)
Change Notes
- 1989-07-27: new
- 1990-10-18: revised
Alternate Formats