Ziegler, J. F. (James F.)
URI(s)
Variants
Additional Information
Exact Matching Concepts from Other Schemes
Closely Matching Concepts from Other Schemes
Earlier Established Forms
Sources
found: International Conference on Ion Beam Surface Layer Analysis, Yorktown Heights, N.Y., 1973. Ion beam ... 1974.
found: Ion implantation, 1984:CIP t.p. (J.F. Ziegler, IBM Thomas J. Watson Res. Center, Yorktown Heights, New York)
Instance Of
Scheme Membership(s)
Collection Membership(s)
Change Notes
1980-01-17: new
1984-06-21: revised
Alternate Formats