URI(s)
Variants
- Oechsner, Hans, 1934-
Identifies LC/NAF RWO
Identifies RWO
Exact Matching Concepts from Other Schemes
Closely Matching Concepts from Other Schemes
Sources
- found: Thin-film and depth-profile analysis, 1984:CIP t.p. (H. Oechsner) t.p. verso (Prof. Dr. Hans Oechsner; Univ. Kaiserslautern, Fed. Rep. of Ger.) data sheet (b. 2/21/34)
Instance Of
Scheme Membership(s)
Collection Membership(s)
Change Notes
- 1984-03-13: new
- 1984-05-04: revised
Alternate Formats