Wallin, Kim
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Additional Information
Exact Matching Concepts from Other Schemes
Closely Matching Concepts from Other Schemes
Sources
- found: Characteristics of the IAEA correlation monitor material for surveillance programmes, 1989:t.p. (Kim Wallin, Technical Research Centre of Finland (VTT), Metals Laboratory)
- found: OCLC, Dec. 17, 2001:(hdg.: Wallin, Kim; usage: Kim Wallin)
- found: An introduction to the development and use of the master curve method, 2005:ECIP t.p. (Kim Wallin) pub. info (b. March 12, 1955; Professor Kim Wallin, VTT Industrial Systems, Espoo, Finland)
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Change Notes
- 2001-12-17: new
- 2022-03-11: revised
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