Bibframe Instance

Title

Proceedings

Other Titles (e.g. Variant)

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Identified By

Lccn: 00501671

Isbn: 0818684941

Isbn: 0818684968 (microfiche)

Supplementary Content

Includes bibliographical references and index

Note

physical details: ill.

"IEEE Computer Society Order Number PR08494"--T.p. verso.

"IEEE Order Plan Catalog Number 98TB100236"--T.p. verso.

Dimensions

28 cm

Extent

ix, 131 p.

Provision Activity

Publication: California 1998

Publication: Los Alamitos, Calif: IEEE Computer Society, 1998

Responsibility Statement

International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, Calif., USA ; sponsored by IEEE Computer Society, Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuit[s] Society ; edited by D. Lepejian ... [et al.]

Media

unmediated

Could not render: bf:code

Issuance

single unit

Could not render: bf:code

Admin Metadata

Status: new

Date: 2000-03-31

Agent: United States, Library of Congress

Admin Metadata

Status: changed