Bibframe Instance

Title

MTDT 2009: 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan

Other Titles (e.g. Variant)

Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing

Identified By

Isbn: 9780769537979 (pbk)

Isbn: 0769537979 (pbk)

Local: ocn498380290 (assigner)

Supplementary Content

Includes bibliographical references and index.

Note

Physical details: ill.

"IEEE Computer Society order number P3797"--T.p. verso.

MTDT 2009 is the 17th conference based on numbering of previous conferences.

Dimensions

28 cm.

Extent

xxii, 95 p.

Provision Activity

Publication: California 2009

Publication: Los Alamitos, Calif: IEEE Computer Society; c2009

Media

Issuance

Admin Metadata

Generation Process: DLC marc2bibframe2 v2.5.0

Status: changed

Encoding Level: minimal

Identified By: bf:Local, 16492202

Change Date: 2017-03-03T17:36:43

Creation Date: 2010-10-06

Description Authentication: LC Copy Cataloging

Assigner: LHL