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Bibframe Instance

Title
International Conference on Defects in Semiconductors 2013: proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013
Identified By
Lccn: 2018302299
Isbn: 9780735412156 (paperback)
Supplementary Content
Includes bibliographical references and index.
Note
Physical details: illustrations
"All papers have been peer reviewed"-- Title page.
Dimensions
28 cm.
Extent
x, 375 pages
Provision Activity
Publication: New York (State) 2014
Publication: Melville, New York: AIP Pubishing; 2014
Responsibility Statement
editors Anna Cavallini, University of Bologna, Bologna, Italy, Stefan K. Estreicher, Texas Tech University, Texas, USA
Issuance
single unit
Carrier
volume