Bibframe Instance

Title

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

Identified By

Lccn: 95075673

Isbn: 0818671025

Local: 33418600 (assigner)

Supplementary Content

Includes bibliographical references and index.

Note

Physical details: ill.

"IEEE catalog number 95TH8065"--T.p. verso.

Dimensions

28 cm.

Extent

ix, 129 p.

Provision Activity

Publication: California 1995

Publication: Los Alamitos, Calif: IEEE Computer Society Press; c1995

Responsibility Statement

edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council

Media

unmediated

Issuance

single unit

Admin Metadata

Generation Process: DLC marc2bibframe2 v2.5.0

Status: changed

Encoding Level: full

Description Conventions: Anglo-American cataloguing rules

Identified By: bf:Local, 4455069

Change Date: 2017-07-21T16:40:16

Creation Date: 1995-06-21

Description Modifier: United States, Library of Congress

Description Authentication: LC Copy Cataloging

Assigner: Bowling Green State University

Bibframe Instance

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