Bibframe Instance

Title

Yield and reliability in microwave circuit and system design

Identified By

Isbn: 0890065276

Supplementary Content

Includes bibliographical references and index.

Note

Physical details: ill.

Dimensions

24 cm.

Extent

xviii, 276 p.

Provision Activity

Publication: Massachusetts 1993

Publication: Boston: Artech House; c1993

Responsibility Statement

Michael D. Meehan and John Purviance

Media

Issuance

Admin Metadata

Generation Process: DLC marc2bibframe2 v2.5.0

Status: prepublication

Encoding Level: full

Identified By: bf:Local, 615896

Change Date: 1993-03-16T11:58:00

Creation Date: 1992-08-19

Assigner: United States, Library of Congress