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  Label Dataset Type Subdivision Identifier
41. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors (Conference) (7th : 2013 : San Diego, Calif.) Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII

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Monograph
18623708
42. Organic semiconductors in sensors and bioelectronics. Conference (4th : 2011: San Diego, California). Organic semiconductors in sensors and bioelectronics IV

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Monograph
17155029
43. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors (Conference) (6th : 2012 : San Diego, Calif.) Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

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Monograph
18480261
44. Discrete semiconductors. Power semiconductors. Digest update

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Serial
10854570
45. IEEE International Conference on Advanced Thermal Processing of Semiconductors IEEE International Conference on Advanced Thermal Processing of Semiconductors

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Serial
15634720
46. International Conference on Defects in Semiconductors (27th : 2013 : Bologna, Italy) International Conference on Defects in Semiconductors 2013

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Text
Monograph
20539680
47. IEEE International Conference on Advanced Thermal Processing of Semiconductors IEEE International Conference on Advanced Thermal Processing of Semiconductors

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15634694
48. United States. National Advisory Committee on Semiconductors. Capital investment in semiconductors Arlington, Va: National Advisory Committee on Semiconductors

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49. State-of-the-Art Program on Compound Semiconductors (38th : 2003 : Paris, France) State-of-the-Art Program on Compound Semiconductors XXXVIII and wide bandgap semiconductors for photonic and electronic devices and sensors III

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Monograph
13097422
50. State-of-the-Art Program on Compound Semiconductors (43rd : 2005 : Los Angeles, Calif.) State-of-the-Art Program on Compound Semiconductors : (SOTAPOCS XLIII) and Nitride and Wide Bandgap Semiconductors for Sensors, Photonics, and Electronics VI

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Monograph
14049761
51. State-of-the-Art Program on Compound Semiconductors (39th : 2003 : Orlando, Fla.) State-of-the-Art Program on Compound Semiconductors XXXIX and Nitride and Wide Bandgap Semiconductors for Sensors, Photonics and Electronics IV

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Monograph
13285356
52. Radiative processes and dephasing in semiconductors

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Monograph
1184522
53. International Conference on the Physics of Semiconductors (31st : 2012 : Zurich, Switzerland) The Physics of semiconductors Melville, New York: AIP Publishing; 2014

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Instance 19253162
54. State-of-the-Art Program on Compound Semiconductors (30th : 1999 : Seattle, Wash.) State-of-the-Art Program on Compound Semiconductors (SOTAPOCs XXX) Pennington, New Jersey: Electrochemical Society; c1999

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Instance 201953
55. International Conference on the Physics and Technology of Compensated Semiconductors (1985 : Madras, India) Physics and technology of compensated semiconductors Madras, India: COSTED; 1985-

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Instance 4847649
56. State-of-the-Art Program on Compound Semiconductors (24th : 1996 : Los Angeles, Calif.) Proceedings of the Twenty-fourth State-of-the-Art Program on Compound Semiconductors Pennington, NJ: Electrochemical Society; c1996

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Instance 2091263
57. Conference on the Metallurgy of Elemental and Compound Semiconductors (1960 : Boston) Metallurgy of elemental and compound semiconductors New York: Interscience Publishers; [1961]

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Instance 9837205
58. International Conference on Radiation Effects in Semiconductors, Dubrovnik, Yugoslavia, 1976 Radiation effects in semiconductors, 1976 London: Institute of Physics; 1977

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Instance 837240
59. International Conference on Radiation Physics of Semiconductors and Related Materials (1979 : Tbilisi, Georgian S.S.R.) Radiation physics of semiconductors and related materials, 1979 Tbilisi: Tbilisi State University Press; 1980

BIBFRAME Instances
Instance 3755906
60. International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (6th : 2000 : Fukuoka, Japan) Beam injection assessment of microstructures in semiconductors Uetikon-Zuerich, Switzerland: Scitec Publications; c2001

BIBFRAME Instances
Instance 12610125


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