URI(s)
Identifies LC/NAF RWO
Exact Matching Concepts from Other Schemes
Sources
- found: Semiconductor measurement technology ... 1987:t.p. (Jane Walters; U.S. Dept. of Commerce, Natl. Bur. of Stds., Natl. Enginr. Lab., Cntr. for Elec. and Electrical Eng., Semiconductor Elec. Divs., Gaithersburg, MD)
Instance Of
Scheme Membership(s)
Collection Membership(s)
Change Notes
- 1987-07-23: new
- 2008-04-09: revised
Alternate Formats