Lee, Stuart M.
URI(s)
Identifies LC/NAF RWO
Identifies RWO
Exact Matching Concepts from Other Schemes
Closely Matching Concepts from Other Schemes
Sources
- found: Internat'l SAMPE Electronics Conf. (1st : 1987 : Santa Clara, Calif.). Electronic materials and processes, 1987:t.p. (Stuart M. Lee) p. v (Society for the Advancement of Material and Process Engrg.)
Instance Of
Scheme Membership(s)
Collection Membership(s)
Change Notes
- 1987-12-14: new
- 1988-02-09: revised
Alternate Formats